Given key factors like the speed of turns, the material of the track and the climate of surrounding areas, these are seven of ...
Abstract: The paper provides an overview of the current state of research in the field of combinational circuits reliability and parameters. Architecture of OpenLane flow, its components and main ...
Abstract: In this paper we propose a method for the automatic test pattern generation for detecting stuck-at-faults in combinational VLSI circuits using genetic algorithm (GA). Derivation of minimal ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results